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. 2022 Jan 12;22:12. doi: 10.1186/s12911-021-01726-0

Table 2.

Credible interval overlap measures, area overlap measures, standardized differences in means (SMD), and Hellinger distances based on posterior samples from the original calibrated model (porig(θy)), the start from scratch method for recalibration that incorporates new screen-detection rate targets (pscratch(θy,z)) and the sequential recalibration method that starts from the original calibrated posterior samples when adding in the new target (pseq(θy,z))

porig(θy) and
pscratch(θy,z)
pseq(θy,z) and
pscratch(θy,z)
Parameter CI
overlap
Area
overlap
SMD Hellinger CI
overlap
Area
overlap
SMD Hellinger
Sojourn time
 λ2 0.57 0.14 1.75 0.70 0.93 0.88 0.06 0.07
 λ1 0.00 0.01 5.76 0.98 0.98 0.90 0.11 0.05
 λ3 0.04 0.04 2.76 0.90 0.96 0.92 0.02 0.05