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. 2022 Jan 14;8(2):eabl8812. doi: 10.1126/sciadv.abl8812

Fig. 2. Characterization of the material surface properties using CA, high-resolution XPS, and AFM.

Fig. 2.

(A) CA on the as-deposited and derivatized copolymers, i.e., CP55, CP26, and CP17, where CA for each film was measured at the derivatization temperatures of 40, 60, and 100°C. The dashed lines indicated the CA values of PVI and PDVB, respectively. (B) Chemical structures of imidazole and the imidazolium-based zwitterionic moieties and their XPS high-resolution scans of N(1s) for CP55 and its derivatives. (C) AFM images of uncoated Si wafer and wafer coated with CP55 or CP55-60.