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. 2021 Dec 24;3(1):100202. doi: 10.1016/j.xinn.2021.100202

Figure 8.

Figure 8

STM measurement of topography and tunneling spectra on Nd1−xSrxNiO2 film

(A) 3D illustration of the topographic image after topotactic reaction method; one can see the surface roughness about 1–2 nm.

(B) A tunneling spectrum with a V-shape, which is measured on the rough surface. The Dynes model fitting yields a gap function Δ = 3.9cos2θ (meV).

(C) A tunneling spectrum with full gap feature, which is measured on the rough surface. The Dynes model fitting is Δ = 2.35(0.85 + 0.15cos4θ) (meV).

(D) 3D illustration of the topographic image after a long-time vacuum annealing. The roughness becomes much smaller. We can see a clear step with the height about 0.17 nm, being consistent with half of the unit cell height.

(E) A typical V-shape spectrum measured on the smooth surface. A gap function Δ = 3.95(0.95cos2θ + 0.05cos6θ) (meV) is used in the fitting.

(F) A mixture of the two-gap features on the spectrum is measured on the smooth surface. Dynes fitting results, Δ1 = 5.3(0.8cos2θ + 0.2cos6θ) (meV), Δ2 = 2 meV, p1 = 85%, and p2 = 15%. Adapted from Gu et al.174