Table 2.
Cryo‐EM data collection and structural refinement statistics for class I and class II complexes
| Class I | Class II | |
|---|---|---|
| Data collection and processing | ||
|
Magnification Total micrographs Exposure time [s] Movie frames Pixel size [Å] |
75 000 3472 1 39 1.085 |
75 000 2878 1 39 1.084 |
| Defocus range [µm] | ‐1.8 to ‐3.6 | ‐1.5 to ‐3 |
| Voltage [kV] | 300 | 300 |
|
Electron dose [e– Å–2] Detector Total particles FSC threshold Reconstruction Software Symmetry Particles Resolution [Å] |
55 Falcon III 1328947 0.143 Relion C1 39703 4.2 |
79.1 Falcon III 774955 0.143 Relion C1 74282 4.5 |
|
Refinement Resolution [Å] R.m.s.deviations |
4.2 | 4.5 |
| Bond length [Å] | 0.003 | 0.003 |
| Bond angle [°] | 0.772 | 0.765 |
| Ramachandran plot | ||
| Favored regions [%] | 92.71 | 94.73 |
| Allowed regions [%] | 6.97 | 5.07 |
|
Outlier Validation All‐atom clash score Rotamer outliers (%) C‐beta deviations |
0.33 4.48 0.29 0 |
0.20 5.05 0.21 0 |