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. Author manuscript; available in PMC: 2022 Feb 7.
Published in final edited form as: J Vis Exp. 2021 Mar 20;(169):10.3791/62348. doi: 10.3791/62348

Figure 3.

Figure 3.

Example of (A) Atomic force microscopy (AFM) characterization of the DNA tension probe surface; and raw microscopy images of a DNA tension probe surface with good quality in (B) RICM and (C) Cy3B channel.