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. 2022 Feb 12;15(4):1368. doi: 10.3390/ma15041368
LVDT Linear-variable differential-transformers
AGI Average-grain intercept
SSD Statistically-stored dislocations
GND Geometrically-necessary dislocations
UTM Universal-testing machine
3D Three-dimensional
T Thickness
D Grain-size
E Young’s modulus
ε Plastic-strain
𝜌 Density
Ҏ Conventional effective plastic-strain
Ra Arithmetic-average of the roughness-profile
V Voltage