| 2D | two-dimensional |
| 3D | three-dimensional |
| AFM | Atomic Force Microscopy |
| BIF | Barrier Improvement Factor |
| EMI | Electromagnetic Interference |
| RSA | Random Sequential Addition |
| RVE | Representative Volume Element |
| TEM | Transmission Electron Microscopes |
| 2D | two-dimensional |
| 3D | three-dimensional |
| AFM | Atomic Force Microscopy |
| BIF | Barrier Improvement Factor |
| EMI | Electromagnetic Interference |
| RSA | Random Sequential Addition |
| RVE | Representative Volume Element |
| TEM | Transmission Electron Microscopes |