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. 2022 Feb 17;7(8):7297–7303. doi: 10.1021/acsomega.1c07113

Figure 2.

Figure 2

Characterization of transferred graphene films on SiO2/Si substrates. SEM images of (a) conventional transfer method. (b) Soxhlet transfer method. Color framed insets represent zoomed areas. The AFM profile of (c) conventional transfer method. (d) Soxhlet transfer method, scale bare is 1 μm. Inset: The AFM line profile graph for both transfer techniques.