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. 2021 Dec 15;26(3):2949–2963. doi: 10.1007/s00784-021-04277-w

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© The Author(s) 2021

Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 4 — EDS elemental analysis using Phenom Element Identification software 3.8.4.0. A Quantitative EDS analysis for CAP application identifying shifts of the atomic concentration for implant materials. Influences on the elemental composition using application times of 60 s/120 s. B Monte-Carlo simulation for EDS spectra and electron profiles of different implant surfaces/blue dotted line indicating the coating layer of titanium (Bonit®) and superficial layer of zirconia (Zircapore®) specimens. All the statistical significance values were declared as p < 0.05