Figure 3.

Reconstruction of QRM nanobar phantom die acquired over a single projection series. Projection from the side including both case dies (a). The zoomed-in elements of the reconstructed vertical die (b′) qualitatively demonstrate the resolution of elements of defined size. Patterns including line pairs and dots ranging from 10 µm to 1 µm (c′) are shown, along with a dot pattern containing elements that are 2 µm in diameter (e′), an etched QRM symbol (f′), and the reconstruction of the same Siemens star (d′) previously shown as a projection in Fig. S1.