| FIB | Focused ion beam |
| FS | Friction surfacing |
| SEM | Scanning electron microscope |
| WLI | White light interferometry |
| XPS | X-ray photoelectron spectroscopy |
| FIB | Focused ion beam |
| FS | Friction surfacing |
| SEM | Scanning electron microscope |
| WLI | White light interferometry |
| XPS | X-ray photoelectron spectroscopy |