µc-Si:H |
Microcrystalline silicon |
1D |
One-dimensional |
2D |
Two-dimensional |
3D |
Three-dimensional |
Al-BSF |
Aluminum back surface field |
AAM |
Anodic alumina membrane |
ARC |
Antireflection coating |
AFM |
Atomic force microscopy |
a-Si:H |
Hydrogenated amorphous silicon |
AZO |
Alumina-doped zinc oxide |
CdS |
Cadmium sulfide |
CdTe |
Cadmium telluride |
CIGS |
Copper indium gallium diselenide |
c-Si |
Crystalline silicon |
CTL |
Charge carrier transport layer |
DNA |
Deoxyribonucleic acid |
DPN |
Dip-pen lithography |
EBL |
Electron beam lithography |
EM |
Electromagnetic |
FIB |
Focused ion beam |
LIL |
Laser interference lithography |
LSPP |
Localized surface plasmon polariton |
LSPR |
Localized surface plasmon resonance |
LSP |
Localized surface plasmon |
MCPS |
Microcone patterned substrate |
NIL |
Nanoimprint lithography |
NPs |
Nanoparticles |
NSL |
Nanosphere lithography |
OPV |
Organic photovoltaics |
PCE |
Power conversion efficiency |
PV |
Photovoltaics |
QCS |
Quasicrystal structure |
RCWA |
Rigorous coupled wave analysis |
SCS |
Scattering cross-section |
SECM |
Scanning electrochemical microscopy |
SEM |
Scanning electron microscopy |
SERS |
Surface enhanced Raman spectroscopy |
SPP |
Surface plasmon polariton |
SPR |
Surface plasmon resonance |
SSD |
Solid-state dewetting |
SThM |
Scanning thermal microscopy |
TCO |
Transparent conductive oxide |
TEM |
Transmission electron microscopy |
TiN |
Titanium nitride |
TiO2
|
Titanium oxide |
TW |
Terawatt |
UV |
Ultraviolet |
ZrN |
Zirconium nitride |
λ |
Wavelength |
Λ |
Periodic structure |