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. 2022 Feb 25;12(5):788. doi: 10.3390/nano12050788
µc-Si:H Microcrystalline silicon
1D One-dimensional
2D Two-dimensional
3D Three-dimensional
Al-BSF Aluminum back surface field
AAM Anodic alumina membrane
ARC Antireflection coating
AFM Atomic force microscopy
a-Si:H Hydrogenated amorphous silicon
AZO Alumina-doped zinc oxide
CdS Cadmium sulfide
CdTe Cadmium telluride
CIGS Copper indium gallium diselenide
c-Si Crystalline silicon
CTL Charge carrier transport layer
DNA Deoxyribonucleic acid
DPN Dip-pen lithography
EBL Electron beam lithography
EM Electromagnetic
FIB Focused ion beam
LIL Laser interference lithography
LSPP Localized surface plasmon polariton
LSPR Localized surface plasmon resonance
LSP Localized surface plasmon
MCPS Microcone patterned substrate
NIL Nanoimprint lithography
NPs Nanoparticles
NSL Nanosphere lithography
OPV Organic photovoltaics
PCE Power conversion efficiency
PV Photovoltaics
QCS Quasicrystal structure
RCWA Rigorous coupled wave analysis
SCS Scattering cross-section
SECM Scanning electrochemical microscopy
SEM Scanning electron microscopy
SERS Surface enhanced Raman spectroscopy
SPP Surface plasmon polariton
SPR Surface plasmon resonance
SSD Solid-state dewetting
SThM Scanning thermal microscopy
TCO Transparent conductive oxide
TEM Transmission electron microscopy
TiN Titanium nitride
TiO2 Titanium oxide
TW Terawatt
UV Ultraviolet
ZrN Zirconium nitride
λ Wavelength
Λ Periodic structure