Figure 1.
XPS in-depth profiles of samples with a nominal composition of 2[Se]/(2[Se] + 3[Sb]): (a) 0.36, (b) 0.48, (c) 0.53, and (d) 0.54, (e, f) distribution of Se out of the stoichiometry for the 0.53 and 0.54 samples, respectively.
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