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. 2022 Mar 3;13:843033. doi: 10.3389/fpls.2022.843033

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Copyright © 2022 Meng, Wen and Zhang.

This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.

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Differentially expressed genes in two maize inbred lines. (A) The number of up-regulated and down-regulated differentially expressed genes (DEGs) between low-temperature sensitive maize (SM) and low-temperature resistance maize (RM) lines. (B) Venn diagram of up-regulated DEGs in SM_LNTvsNT and RM_LNTvsNT. (C) Venn diagram of down-regulated DEGs in SM_LNTvsNT and RM_LNTvsNT. SM: low-temperature sensitive maize inbred line; RM: low-temperature resistant maize inbred line. NT treatment: seeds germinated at 25°C for 4 days. LNT treatment: maize seeds germinated at 13°C for 4 days followed by 25°C for 2 days. SM_LNTvsNT: SM line samples under LNT compared with those under NT. RM_LNTvsNT: RM line samples under LNT compared with those under NT.