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. 2022 Mar 1;7(10):8506–8517. doi: 10.1021/acsomega.1c06261

Figure 2.

Figure 2

(a,b,e,f) Low-magnification back-scattered electron (BSE) and (c,d,g,h) secondary electron (SE) micrographs captured using an SEM indicating the defect population within the samples fabricated using different Eds; enlarged views shown in the insets reveal the types of defects (A,B—lack of fusion and C—balling).