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. 2022 Feb 28;16(3):4139–4151. doi: 10.1021/acsnano.1c09843

Table 3. Thickness, Roughness, and Mass Density (ρ) of Each Layer Deduced by X-ray Reflectivity (XRR) Fitting for the Interfacial Layer with High Robust Mass Density (Figure 6(c))a.

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a

In the XRR measurement, the ρ of the fitting parameter is proportional to electron density (ρ0). Inline graphic, where ρ0, A, λ, NA, Z, and f + if’’ are electron density, atomic weight, wavelength, Avogadro’s number, atomic number, and anomalous scattering factor of the atomic scattering factor.