. 2022 Feb 28;16(3):4139–4151. doi: 10.1021/acsnano.1c09843

Table 3. Thickness, Roughness, and Mass Density (ρ) of Each Layer Deduced by X-ray Reflectivity (XRR) Fitting for the Interfacial Layer with High Robust Mass Density (Figure 6(c))^a.

In the XRR measurement, the ρ of the fitting parameter is proportional to electron density (ρ₀). Inline graphic , where ρ₀, A, λ, N_A, Z, and f^’ + if^’’ are electron density, atomic weight, wavelength, Avogadro’s number, atomic number, and anomalous scattering factor of the atomic scattering factor.

Table 3. Thickness, Roughness, and Mass Density (ρ) of Each Layer Deduced by X-ray Reflectivity (XRR) Fitting for the Interfacial Layer with High Robust Mass Density (Figure 6(c))a.

Table 3. Thickness, Roughness, and Mass Density (ρ) of Each Layer Deduced by X-ray Reflectivity (XRR) Fitting for the Interfacial Layer with High Robust Mass Density (Figure 6(c))^a.