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. 2022 Mar 15;15(6):2144. doi: 10.3390/ma15062144

Figure 2.

Figure 2

GIXRD curves obtained for Ta2O5/SiO2 mixed layers with different volumetric composition in the angular range 5–42° with 0.6 (a) and 2.0 mm slit (b). The colored segments are added in order to qualitatively show the evolution of the first “structure” characterizing the diffraction profiles.