Skip to main content
. 2022 Mar 17;12(6):993. doi: 10.3390/nano12060993

Figure 1.

Figure 1

Characterization of 20 nm SiO2 NPs: (a) Scanning electron microscopy image; (b) Transmission electron microscopy image; (c) Dynamic light scattering size analysis; (d) Scanning mobility particle sizer analysis; (e) Performance comparison in deionized water and serum-free DMEM.