. 2022 Apr 2;55(Pt 2):362–369. doi: 10.1107/S1600576722002230

Table 1. Predicted and fitted thin-film parameters based on the reflectivity data of a PDI-C8 film on Si/SiO_x (shown in Fig. 5 ▸).

The ground truth labels were obtained via a manually supervised LMS fit. After applying the described q _z variation, the prediction results improved significantly. A subsequent LMS refinement only led to comparatively small improvements.

	Thickness (Å)	Roughness (Å)	SLD (× 10⁻⁶ Å⁻²)
Ground truth	688.3	27.1	10.5
Prediction	536.7	30.3	11.2
Shift + prediction	690.8	31.0	11.0
Shift + prediction + fit	690.5	27.5	10.8

Table 1. Predicted and fitted thin-film parameters based on the reflectivity data of a PDI-C8 film on Si/SiO x (shown in Fig. 5 ▸).

Table 1. Predicted and fitted thin-film parameters based on the reflectivity data of a PDI-C8 film on Si/SiO_x (shown in Fig. 5 ▸).