Skip to main content
. 2022 Mar 24;15(7):2409. doi: 10.3390/ma15072409
AE Acoustic emission
ANOVA Analysis of variance
CLSM Confocal laser scanning microscope
DOC Depth of cut
EDS Energy dispersive spectroscopy
FFT Fast Fourier transformation
PSD Power spectral density
PCD Polycrystalline diamond
RLS Raman laser spectroscopy
SAM Scanning acoustic microscope
SEM Scanning electron microscope
SSD Sub-surface damage
SiC Silicon carbide
SPDT Single point diamond turning
WOC Width of cut
XRD X-ray diffraction