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. 2022 Apr 15;12(8):1368. doi: 10.3390/nano12081368

Figure 8.

Figure 8

In and Al amount in the CL/WL regions expressed as deposited MLs. The results are obtained from the calibrations of the area in averaged profiles along the growth direction from EDX measurements in thin layers. Error bars shows the upper and lower 95% confidence limits using the standard error for the sample mean, multiplied by 1.96.