Skip to main content
. 2021 May 19;11(29):18050–18060. doi: 10.1039/d1ra02382a

Fig. 3. AFM, SEM and TEM analyses of the pm-CuO NPs, (A) AFM data of the pm-CuO/ITO electrode 2D (left), and 3D (right), (B) pm-CuO NPs micrography by SEM, and (C) TEM analysis of the pm-CuO NPs; inset, histograms of the average particle size (left); zoom portion of left TEM image demonstrating NPs, SAED analysis, and HR-TEM of the pm-CuO NPs (right).

Fig. 3