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. 2022 Apr 22;20:197. doi: 10.1186/s12951-022-01420-x

Fig. 1.

Fig. 1

SiO2 NPs under investigation. A Scanning electron microscope (SEM) images of the particle. Scale bar, 500 nm. B Particle size distribution based on the SEM image analysis. Averages ± standard deviations