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. 2022 Apr 27;13:2260. doi: 10.1038/s41467-022-29762-y

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© The Author(s) 2022

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — a One panel of an unprocessed image plate. b Projection of the above image plate into d-spacing-ϕ space after background subtraction. The one-dimensional X-ray diffraction pattern shown on the upper axis represents integration in ϕ over the region between the blue lines. The textured diffraction from LiF can be distinguished from the more extended features from either the W pinhole or B1 SiC.