Fig. 7. SP and EOF data using Ludox tracer particles for semiconductive silicon wafer (a). EOF measurement and SP data in all pH range for Ni-based conductive alloy (b). Apparent zeta potential versus surface displacements for Ni-based alloy at pH 9 and 2 mM ionic strength (c) with corresponding phase plots (d). The damage caused on the Ni-based alloy after EOF measurement in shown in ((e); right Ni-based alloy), where bar is 4 mm. Observation of possible electrochemical reaction with bubbles formation is presented in (f).
