Fig. 5. SEM micrograph of the SAuNT layer on the wafer surface (left side) with the corresponding Raman spectra (right side). Upper panel: Raman spectra measured after adsorption of 4-NTP molecules on the bare (black) and modified (red) AuNTs at a laser power of 2 mW. The intensity of the black spectrum is scaled by a factor of 10 to make it better visible. Lower panel: same for a laser power of 10 mW.
