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. 2020 Jun 3;10(36):21129–21135. doi: 10.1039/d0ra02699a

Fig. 1. (a) XRD patterns recorded at room temperature of the CoSb3 doped Te thin films (T1, T2, T3, and T4) and the simulated CoSb3 pattern. The (*) attest to the presence of free-Sb reflexion and (#) to the low-intensity peak (015) and (110) of the Sb2Te3 nanoparticles, and (b) evolution of the lattice parameter a and the highlight of the (310) reflexion shift (inset) with the Te target power (the red line is just a guide to the eye).

Fig. 1