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. 2020 Jul 7;10(43):25669–25678. doi: 10.1039/d0ra04568c

Fig. 2. (a) XRD pattern of S1 (pure MAX), S2 (MXene etched at 45 °C), S3 (55 °C), S4 (65 °C), S5 (75 °C), S6 (85 °C). (b) Variation of c-LP of MAX and MXene for different sample series. (c and d) SEM images of MAX and MXene. (e) TEM image of Nb2C MXene flakes showing typical layered structure. (f) Table showing the atomic percentage of elemental composition of MAX and MXene obtained from EDX.

Fig. 2