Fig. 4. (A) SEM image of the printed sample without sintering. (B), (C) and (D) EDS mappings in the same area as that in (A) with Al, O, and C signals, respectively. (E) SEM image of the sample at the sintering temperature of 900 °C. (F), (G) and (H) EDS mapping at the same area as that in (E) with Al, O, and C signals, respectively. (I) and (J) the weight and atomic percent of the sample at different sintering temperatures, respectively.
