Fig. 3. (a) X-ray diffraction patterns of MZO thin films for various Mg concentrations: (a) 0, (b) 0.8, (c) 1.6, (d) 2.4, (e) 3.3, and (f) 4 mM. The XRD peaks of the FTO substrate are marked by asterisks. (b) Mg doping content dependent angular position and full-width-half-maximum (FWHM) of (002) peaks variation in MZO structures.
