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. 2019 Jan 2;9(2):576–591. doi: 10.1039/c8ra08319c

XPS measured surface elements concentrations.

Sample label Atomic concentration (at%)
O Si C N F Sb Pb Na Ag
1 29.0 25.6 23.5 21.0 0.5 0.2 0.1 <0.1 0.0
1m 29.6 34.8 12.8 22.2 <0.1 0.4 0.1 0.2 0.0
2 33.7 31.7 11.2 22.0 0.1 0.1 0.6 0.5 0.0
3 48.0 27.8 11.4 11.7 <0.1 0.6 0.3 0.3 0.0
1(Ag) 12.6 0.0 25.9 0.0 0.0 0.0 0.0 0.0 61.5
1m(Ag) 15.7 2.8 29.7 0.0 0.0 0.0 0.0 0.0 51.8
2(Ag) 15.2 2.8 22.6 0.0 0.0 0.0 0.1 2.0 57.4
3(Ag) 16.8 3.4 39.9 0.0 0.0 0.0 <0.1 0.0 39.8