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. 2022 Apr 29;9(Pt 3):386–398. doi: 10.1107/S2052252522004183

Table 1. Data-collection and structure-refinement statistics.

Values in parentheses are for the highest resolution shell.

BLG mutant I56F/L39A/M107F (FAF) I56F/L39A/M107W (FAW)
Structure FAF FAF–DSM FAW FAW–DSM#1 FAW–DSM#2 FAW–DSM#3
Data processing
 Beamline 21-ID-F, APS EMBL P13, PETRA III 14.2, BESSY II 14.2, BESSY II 14.1, BESSY II 14.1, BESSY II
 Wavelength (Å) 0.97872 0.97625 0.91840 0.91840 0.91840 0.91840
 Space group P21 I212121 P3221 I212121 I212121 P321
a, b, c (Å) 45.91, 64.30, 55.50 55.82, 73.34, 179.70 53.08, 53.08, 111.47 55.67, 70.15, 179.02 55.81, 70.52, 178.80 66.30, 66.30, 60.63
 α, β, γ (°) 90, 112.89, 90 90, 90, 90 90, 90, 90 90, 90, 90 90, 90, 90 90, 90, 90
 Resolution limit (Å) 50.00–1.80 (1.83–1.80) 46.38–1.70 (1.80–1.70) 45.97–1.80 (1.91–1.80) 45.45–1.80 (1.91–1.80) 45.52–1.69 (1.79–1.69) 41.69–1.55 (1.64–1.55)
 Total No. of reflections 101450 529706 139531 181280 517429 445871
 No. of unique reflections 27108 (1363) 41144 (6512) 17450 (2615) 32842 (5196) 39985 (6354) 22796 (3482)
 Multiplicity 3.70 (3.70) 12.90 (12.70) 4.31 (4.02) 5.52 (5.60) 12.94 (12.6) 10.30 (9.11)
 〈I/σ(I)〉 35.10 (2.00) 17.97 (1.88) 13.73 (1.30) 14.42 (1.63) 19.43 (1.63) 23.24 (1.98)
R meas (%) 8.0 (45.4) 6.9 (135.1) 5.7 (97.2) 7.4 (119.1) 7.2 (168.0) 5.1 (102.2)
 Completeness (%) 99.0 (98.5) 99.8 (98.6) 99.8 (99.1) 99.2 (98.7) 99.6 (99.3) 99.9 (99.4)
 CC1/2 (%) 99.2 (88.4) 100.0 (90.3) 99.9 (59.0) 99.9 (85.1) 100.0 (85.7) 100.0 (87.0)
Structure refinement
 Reflections (total/test set) 26016/1074 40027/1042 16448/1000 31839/1000 38980/1000 21796/1000
R/R free (%) 19.9/23.3 20.4/23.3 18.3/22.6 18.4/22.1 18.9/23.6 19.9/23.4
 R.m.s.d., bond lengths (Å) 0.011 0.010 0.011 0.011 0.012 0.011
 R.m.s.d., angles (°) 1.66 1.60 1.62 1.68 1.68 1.66
 Ramachandran plot statistics (%)
  Allowed 96 98 97 98 98 98
  Favored 4 2 3 2 2 2
  Outliers 0 0 0 0 0 0
 PDB code 7q18 7q2n 7q17 7q2o 7q2p 7q19
 Raw diffraction data https://doi.org/10.18150/3BXUVE https://doi.org/10.18150/RTXPKH https://doi.org/10.18150/V2BG7N https://doi.org/10.18150/C8ZOOT https://doi.org/10.18150/2ABUX2 https://doi.org/10.18150/SSQN7W