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. 2019 Jul 29;9(40):23343–23351. doi: 10.1039/c9ra01295h

Fig. 4. AFM topographic image of (a) pristine graphene and annealed at (b) 200 °C, (c) 300 °C and (d) 400 °C. (e) PMMA coverage calculated in the imageJ software and roughness parameters Rq related to different RTA temperature from AFM images.

Fig. 4