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. 2021 Dec 15;9(4):nwab225. doi: 10.1093/nsr/nwab225

Figure 1.

Figure 1.

Characterizations of SNCO epitaxial films. (a) Temperature dependence of electrical resistivity, normalized to the value of 250 K, in electron-doped Sr1−xNdxCuO2 (0.080 ≤ x ≤ 0.107) cuprate films, with a nominal thickness of ∼13 nm. Arrows denote the onset temperatures of superconductivity. Inset shows the schematic crystal structure of SNCO. (b) Electrical resistivity versus temperature of Sr0.893Nd0.107CuO2 measured under different magnetic fields, normalized to the value of 50 K for clarification. (c) Atom-resolution STM topography (3.6 nm × 3.6 nm, V = −1.5 V, I = 20 pA) of x ∼ 0.100 SNCO film. The bright spots denote the Cu atoms at the top layer. A single CuO2 plaquette with Cu 3d (orange) and O 2p (green) orbitals is shown. (d) Temperature dependence of differential conductance dI/dV spectra on the superconducting CuO2 plane. Setpoint: V = −200 mV and I = 100 pA.