Fig. 6. Parameters obtained from high frequency (∼102–106 Hz) semicircle IS analysis of the FP-MPSC device with different spacer film thickness measured at between 1.1 V and 0 V, under weak illumination (0.1 sun). (a) Series resistance. (b) Resistance related to perovskite. (c) Capacitance related to perovskite and (d) associated constant phase value.
