Skip to main content
. 2018 Jan 2;8(3):1296–1312. doi: 10.1039/c7ra10929f

Electrical studies using the four-point probe technique.

Voltage (V) Resistivity (Ω cm) Average (Ω cm)
PAM-I (1) 3.56 2.19 2.19
PAM-II (2) 32.24 19.85 20.45
PAM-II (3) 35.84 22.06
PAM-II (4) 31.59 19.45
Silicon wafer_1 (bare) 15.32 9.43 10.02
Silicon wafer_2 (bare) 17.24 10.61