Fig. 3. Two-dimensional GIXRD patterns of (a) the pristine perovskite thin film, (b) that with 0.5 vol%, (c) 1 vol%, (d) 2 vol%, and (e) 3 vol% GO in perovskite precursor, respectively; the azimuthally integrated intensity profiles derived from the diffraction patterns for the different films in (f) and these profiles around (110) peak in (g), respectively; (h) the radially integrated intensity profiles derived from the diffraction patterns at q ≈ 10 nm⁻¹ with different amount of GO.