Fig. 8. (a) HAADF-STEM micrograph of WS1.8Se0.2. The corner outlined in red is a multilayer region. The rest of the image is a monolayer region. Elemental EDX maps of (b) selenium overlayed on the HAADF-STEM micrograph of WS1.8Se0.2. The red box region in (b) was used for quantifying the degree of clustering within the monolayer. (c) The enlarged red box region shown from (b) with colored dots added to illustrate the nearest-neighbor counting process.
