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. 2018 Apr 9;8(24):13142–13147. doi: 10.1039/c7ra12904a

Fig. 4. Charge electron transfer resistant, RCT (a); charge transport resistant, Rt (b); capacitance (c) and electron life time, τ (d) of the DSCs using Inline graphic [ButMIm]OTf, Inline graphic [AMIm]OTf, Inline graphic [PentMIm]OTf calculated from simulated data and the Bode plots. Data was collected at various applied potentials.

Fig. 4