. 2018 May 4;8(30):16593–16602. doi: 10.1039/c8ra02235f

Full Width at Half Maximum (FWHM) and reflectance peak intensity (%) of pure SiO₂ and 0.05% graphene oxide doped SiO₂ particles at a stopband with particle sizes ranging from 198.8 nm to 288.2 nm.

SiO₂ particle size (nm)	λ _max (nm)	FWHM value			Reflectance peak intensity (%)
SiO₂ particle size (nm)	λ _max (nm)	Pure SiO₂	SiO₂ + 0.05% GO	Increase ↑ (%)	Pure SiO₂	SiO₂ + 0.05% GO	Decrease ↓ (%)
198.8	448	30.0	30.17	0.57	13.33	11.08	16.88
224.3	499.3	29.85	30.94	3.65	44.26	30.64	30.77
232.0	510.2	33.32	41.72	25.2	21.89	14.57	33.44
258.7	550	30.73	39.20	27.6	36.54	22.55	38.29
288.2	594	27.79	39.03	40.45	19.43	10.74	44.72

Full Width at Half Maximum (FWHM) and reflectance peak intensity (%) of pure SiO2 and 0.05% graphene oxide doped SiO2 particles at a stopband with particle sizes ranging from 198.8 nm to 288.2 nm.