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. 2018 Jul 24;8(46):26356–26363. doi: 10.1039/c8ra04719g

Summary of measured physical characteristics: Raman spectroscopy ID/IG-ratio, four-point probe sheet resistance (Ω □−1), and XPS wide scan atomic concentrations (at%).

Fe at% Raman ID/IG Sheet resistance XPS wide at%
Fe 2p O 1s C 1s
ta-C 0.15 ± 0.08 4.2 ± 0.2 95.6 ± 0.2
2 0.22 ± 0.02 3.9 × 108 0.4 ± 0.0 5.7 ± 0.0 93.7 ± 0.1
5 0.25 ± 0.04 2.4 × 105 1.2 ± 0.0 7.5 ± 0.1 90.9 ± 0.1
10 0.37 ± 0.02 7.6 × 104 2.5 ± 0.0 10.6 ± 0.4 86.4 ± 0.6