Fig. 5. Electron diffraction patterns and background subtracted profiles of azimuthal integration (panels top) and fits by multiple overlapping Voigt peaks of the latter (panels bottom), corresponding to planes of Cu (blue), Pd (green), alloyed Cu/Pd (cyan), Cu2O (orange) and CuO (violet). The patterns were measured for dried samples of nanoparticles on TEM grids from mixtures of suspensions of Cu and Pd: (a) prepared by pulsed laser ablation in ethanol and then following subsequent collimated irradiation [configuration of Fig. 1(b)] of (b) 5, (c) 60 and (d) 120 min, as well as focused irradiation [Fig. 1(c)] of (e) 1 and (f) 15 min. The darkened peaks in panel (a) were measured by microfocus X-ray diffraction.
