| (1) X-ray diffraction (XRD) |
(1) X-ray diffraction (XRD) is a simple and useful tool for the analysis of oxygen vacancy because it reveals the crystal structure and the electron density distribution of periodic arrays of atoms |
| (2) Analysis of X-ray diffraction data using Rietveld refinement has been attempted for the quantitative analysis of oxygen vacancies in terms of oxygen site occupancy |
| (3) X-ray diffraction requires the use of neutrons or synchrotron X-rays |
| (2) Maximum entropy technique |
(1) The maximum entropy method (MEM) is also a suitable tool for the analysis of oxygen because it uses the more precise Rietveld refinement that resolves summation-terminated errors and affords a better structural model |
| (2) The maximum entropy technique presents insignificant modeling errors via the least-biased electronic reconstruction of X-ray diffraction patterns in real space |
