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. 2022 May 10;12:7681. doi: 10.1038/s41598-022-11946-7

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© The Author(s) 2022

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Devices characterization after multiple bending down cycle of 1, 10, 100, 1000 times (a radius of R = 15 mm): (a) Dark density of the devices; (b) Photocurrent density of the devices; (c) Left: Dark and photocurrent (PC) density of the devices at − 0.1 V; Right: Responsivity of the device at 1550 nm (P = 230 μW) at − 0.1 V.