Table 3.

Comparison between the proposed Memristor design and the relevant Memristors presented in literature.

Relevant TRNGs/PUFs designs in the literature	Performed NIST tests	Authors/references
Memristive read and write PUF	–N/A–	28
N-bit read and write Memristive PUF (M-PUF)	–N/A–	29
Hybrid memristor-CMOS PUF	–N/A–	30
Nanocrossbar memristor PUF	–N/A–	26
W/TiN/TiON/SiO2/Si memristor	–N/A–	31
Cu/AlOx and Ti/HfOx memristors	–N/A–	32
TaOx-based devices	All 15 NIST tests	33
	(expensive quality bits generated)
Pt/Ag/Ag:SiO2/Pt memristor	All 15 NIST tests (complex device Structure)	34
	(complex device Structure)
RRAM TRNGs	12 NIST tests	35
Cu/HfO${}_{2-x}/p^{++}$Si Memristor	All 15 combined with the literature	MR-PUF TRNG proposed in this paper
	three additional tests using efficient and low cost structure