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. 2020 Apr 23;10(27):16162–16167. doi: 10.1039/d0ra02476g

Fig. 2. TEM image of IO (a), AIO (b), AIB (c) and high-resolution TEM image of IO (d), AIO (e), AIB (f) sample. TEM-energy-dispersive X-ray spectrum (c inset), (g) HAADF image, and elemental mappings of (h) composite, (i) O, (j) Au, (k) Fe, and (l) P from AIB sample.

Fig. 2