Figure 54.

Crystal growth by vapor transports of CrCl₃ on YSZ substrates. (a) Optical microscopy of CrCl₃ micro- and nanocrystals at YSZ substrate. (b) Optical microscope image of YSZ substrate surface with CrCl₃ sheets with respective thicknesses in dotted boxes. (c) Distribution of thicknesses of CrCl₃ structures on a YSZ substrate after CVT (yellow), after one time of exfoliation (green) and after three times of exfoliation (purple). (d) AFM measurement the height profile of a CrCl₃ nanosheet. (e) Corresponding AFM image of measurement of (d) the white arrow is indicating the measurement. (f) AFM measurement of the height profile a CrCl₃ ultrathin sheet (red line) and monolayer (purple line) after three repeats of exfoliation. (g) Corresponding AFM image of measurement of (f) the white line is indicating the monolayer AFM measurement. All panels are reproduced with permission from ref (600). Copyright 2019 John Wiley and Sons.