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. 2022 May 13;15(10):3508. doi: 10.3390/ma15103508

Figure 9.

Figure 9

The efficiency of four proposed structures as a function of Eg and χ for all passivating and doped layers, including defects at the middle of Eg (a) Contour graphs of the n-i-p structure with p-type wafer base. (b) Contour graphs of the n-i-p structure with n-type wafer base. (c) Contour graphs of the p-i-n structure with the p-type wafer. (d) Contour graphs of the p-i-n structure with n-type wafer base.