Perkin Elmer CHN 2400 (USA) |
The contents C, H, and N |
Jenway 4010 conductivity meter |
Electrolytic or nonelectrolytic character |
Bruker FTIR Spectrophotometer (4000–400 cm−1) |
IR measurements |
Quanta FEG 250 equipment |
Scanning electron microscopy (SEM) images |
X ‘Pert PRO PAN analytical X-ray powder diffraction, target copper with secondary monochromate |
The X-ray diffraction patterns |
JEOL 100 s microscopy |
The transmission electron microscopy images (TEM) |
Flame atomic absorption spectroscopy instrument (Perkin Elmer Analyst 400) |
Metal content and Cl |