Extended Data Fig. 1. Incoming beam identification and tracking.

(a) Charge identification vs. time-of-flight (TOF) for incoming beam ions measured event-by-event using plastic scintillators. The TOF is measured relative to the last scintillators at the BigRIPS fragment separator. The red ellipse represents the cut used to identify ⁸He ions. The peak above ⁸He, with the same TOF is attributed to pile-up events. The peak at smaller TOF and Z = 3 originates from Li. (b) Angular profile of the incoming beam in the XY plane measured by two drift chambers

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